Liedong Zhao‡
a,
Hailan Zhang‡a,
Jiaqi Donga,
Guangxu Zhanga,
Qian Caob,
Zhihai Dingb,
Shufang Wangac,
Jianglong Wang*a and
Zhiliang Li
*ad
aKey Laboratory of High-Precision Computation and Application of Quantum Field Theory of Hebei Province, College of Physics Science and Technology, Hebei University, Baoding 071002, China. E-mail: jlwang@hbu.edu.cn; phd-lzl@hbu.edu.cn
bXianghe Huiwen Energy Saving Technology Co., Ltd, Xianghe 065400, China
cEngineering Research Center of Zero-Carbon Energy Buildings and Measurement Techniques, Ministry of Education, Hebei University, Baoding 071002, China
dInstitute of Life Science and Green Development Hebei University, Baoding 071002, China
First published on 25th July 2025
Ag2Se-based semiconductors have garnered considerable attention as promising candidates for room-temperature thermoelectric (TE) materials, owing to their excellent electrical properties and remarkably low thermal conductivity. However, their practical application necessitates the simultaneous enhancement of both TE and mechanical properties. In this study, Ag2Se powder is synthesized via a straightforward microwave-assisted method. An improvement of ∼28.6% in TE performance and an enhancement of ∼15.4% in mechanical properties are achieved by incorporating amorphous nano-Si3N4 into Ag2Se. The electronic and lattice thermal conductivities of Ag2Se are reduced simultaneously, resulting in a zT of 0.90 at 303 K and an average zT of 0.92 in the temperature range of 303 K to 388 K for the Ag2Se–0.5 wt% Si3N4 sample. These results underscore the potential of Si3N4 as an effective nano-inclusion for concurrently boosting the thermoelectric and mechanical properties of Ag2Se, thereby advancing the development of practical thermoelectric materials. Incorporating amorphous nano-inclusions also shows significant potential for applications in other material systems.
In the search for alternative TE materials, Ag2Se has emerged as a promising candidate material to replace n-type Bi2Te3, owing to its outstanding near-room-temperature TE performance, environmental advantage of no tellurium, and excellent mechanical properties. Ag2Se is a typical “electron crystal, phonon glass” material,10 characterized by high σ, low κ, and high carrier mobility (μ), showing excellent TE conversion capability. Ag2Se has two crystal phases, α-Ag2Se (orthorhombic phase) at lower temperatures and β-Ag2Se (cubic phase) at higher temperatures, with a phase transition at 406 K.11 α-Ag2Se, with inherent low lattice thermal conductivity (κl) and relatively excellent electrical properties,12 has significant TE potential at room temperature. Although there have been numerous studies attempting to improve the TE performance of Ag2Se by manipulating the stoichiometric ratio,13,14 alloying,13,15 and doping,16,17 these methods still have a lot of limitations. While manipulating the stoichiometric ratio can reduce Ag precipitation and inhibit the formation of metastable phases, thereby reducing n and improving μ, the variability in synthesis conditions among laboratories hampers the reproducibility of results.18 Alloying can regulate n and improve mechanical properties, but often leads to a significant decrease in μ and may cause phase separation, resulting in a low zT compared to pure Ag2Se.19 The limited solubility of Ag2Se poses challenges for heterovalent doping, leading to non-uniform distribution and increased local defect concentration, which in turn affects σ and TE performance.20 Research studies indicate that incorporating nanoscale second phases is a promising strategy to enhance the TE performance of Ag2Se. This approach can induce energy filtering effects to enhance S without significantly reducing σ. The nanocrystalline precipitates can also enhance interface phonon scattering and reduce κl. However, current research predominantly focuses on crystalline nanoscale materials,21 with less exploration of amorphous nanoscale materials.22 The disordered structure of amorphous materials significantly impedes the propagation of phonons, resulting in frequent scattering events that diminish the κl.23 Furthermore, the mechanical flexibility of amorphous materials surpasses that of crystalline counterparts, endowing them with a unique advantage in the fabrication of flexible TE devices. Specifically, amorphous nano-Si3N4, characterized by its reduced κ and outstanding mechanical properties, can act as a nanoscale material to elevate the TE efficiency of Ag2Se.
In this study, Ag2Se crystals are synthesized using a microwave-assisted method. The impact of synthesis temperature on the TE is comprehensively investigated. Subsequently, amorphous nano-Si3N4 is incorporated into the optimal sample (200 °C). It is observed that Si3N4 incorporation can significantly diminish the κl while preserving a satisfactory electrical performance, leading to a high zT of 0.95 at 388 K. Simultaneously, the Vickers hardness increases to 0.30 GPa. Various characterization techniques are employed to elucidate the intrinsic mechanisms of the enhanced TE.
Fig. 1 presents the TE properties of Ag2Se samples synthesized at different temperatures. Fig. 1a shows that the σ value of all samples increases from 303 K to 388 K, illustrating the thermal excitation behavior of semiconductors. As the synthesis temperature increases, the σ of all samples first decreases and then increases, while S exhibits the opposite trend, initially increasing and then decreasing. Sample 2 achieves its maximum S of 150.63 μV K−1 at 303 K, as shown in Fig. 1b. To further elucidate the reasons behind the changes in σ and S, Hall tests are conducted, as shown in Fig. S2 (ESI†). It can be observed that the relatively higher σ of samples 1 and 3 is primarily attributed to their elevated n.
The PF of all samples remains relatively stable between 303 K and 388 K (Fig. 1c). Notably, sample 1 maintains the highest PF across the temperature range, achieving a peak of 40 μW cm−1 K−2 at 303 K, primarily attributed to the high σ. Fig. 1d displays the trend of κtot as a function of temperature. κtot increases with increasing temperature, with a more pronounced increase observed for samples 1 and 3 compared to sample 2, primarily due to the presence of elemental Ag with high κtot. Fig. 1e shows the variation in zT with temperature for all samples. Between 303 K and 388 K, the zT of sample 2 increases with increasing temperature, whereas the zT of samples 1 and 3 decreases, mainly due to the abnormal increase in κtot at high temperatures, which negatively impacts the TE performance. Further analysis of the average zT value (zTavg) reveals that sample 2 has the highest zTavg of 0.73, followed by sample 3 with zTavg = 0.62, and sample 1 with zTavg = 0.50.
To further optimize the TE performance, sample 2, which exhibited the highest zTavg, is selected and incorporated with varying amounts of amorphous nano-Si3N4, specifically Ag2Se–x wt% Si3N4 (x = 0, 0.3, 0.5, 0.7). To examine the form of amorphous Si3N4 in the Ag2Se matrix, XRD and XPS analyses are conducted. As shown in Fig. 2a, all major peaks align well with the standard peaks of α-Ag2Se, and no peak corresponding to amorphous Si3N4 is observed. This absence is primarily due to the amorphous nature of Si3N4, though subsequent XPS and TEM analyses confirmed its presence. In Fig. 2b, the peaks at binding energies of 375 eV and 369 eV correspond to the Ag+ 3d3/2 and Ag+ 3d5/2 orbitals, respectively.30 In Fig. 2c, the peaks at 55.4 eV and 54.6 eV correspond to Se2− 3d3/2 and Se2− 3d5/2 orbitals.30 Fig. 2d shows peaks at 102.8 eV and 102.34 eV, which correspond to Si4+, confirming the presence of Si3N4 in the Ag2Se matrix.31
Fig. 2e illustrates the charge density difference for Ag2Se1−xNx, with an isosurface level of 0.008. The charge distribution of each atom in the crystal structure is calculated, revealing that the charge contributions from the Ag cation is ∼0.23 e−, and those from Se and N anions are ∼0.43 e− and ∼0.91 e−, respectively. Notably, the higher electron acquisition ability from N suggests that n can be regulated by introducing additional acceptor energy levels. Fig. 2f presents the ELF diagram of Ag2Se1−xNx, demonstrating the presence of ionic bonding between Ag and N with stronger electron localization compared to that between Ag and Se. First-principles calculations reveal that the binding energy of Ag2Se1−xNx (∼−147.67 eV) is lower than that of Ag2Se (∼−146.10 eV), confirming that the structure of Ag2Se1−xNx is more stable and suggests higher feasibility of N doping.
To investigate the microstructure of Ag2Se–x wt% Si3N4, the sample with x = 0.5 is selected for TEM analysis (Fig. 3a), which revealed the distribution of nano-inclusions within the Ag2Se matrix. Fig. 3b shows the energy dispersive X-ray spectroscopy (EDS) results from the magnified region of Fig. 3a, confirming that the nano-inclusions are amorphous Si3N4. Additionally, a portion of Si3N4 decomposes, allowing N to diffuse into the Ag2Se matrix, while Si precipitates. Furthermore, as shown in Fig. 3c and d, the additionally incorporated Si3N4 primarily resides at the grain boundaries of the Ag2Se crystals.
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Fig. 3 (a) TEM image of the Ag2Se–0.5 wt% Si3N4 sample and (b) its EDS mapping. (c) The SEM image of the Ag2Se–0.7 wt% Si3N4 sample and (d) its EDS mapping. |
To investigate the influence of the incorporation of amorphous Si3N4 on the TE properties of Ag2Se, the electrical properties are measured (Fig. 4). Fig. 4a illustrates the variation of σ with temperature for Ag2Se–x wt% Si3N4. In the temperature range of 303 K to 388 K, the σ of all samples increases gradually with temperature, with that of the Ag2Se matrix reaching a maximum value of 1388.86 S cm−1 at 388 K. Notably, within the range of 303 K to 388 K, the σ of all amorphous Si3N4 incorporated samples is lower than that of the pure Ag2Se matrix, suggesting that the n or μ in the amorphous Si3N4 incorporated samples is reduced. Fig. 4b shows the variation of S for all samples. The negative values indicate that all samples are n-type semiconductors. Within the range of 303–388 K, the absolute value of S decreases gradually as the temperature increases, reaching a minimum of 131.94 μV K−1 at 388 K, primarily due to the increase of n resulting from electron thermal excitation. The S of all amorphous Si3N4 incorporated samples is higher than that of the pure Ag2Se matrix. This may be attributed to a reduction in n or an increase in carrier effective mass (m*). S can be expressed as: , where kB is the Boltzmann constant, e is the elementary charge, h is Planck's constant, and m* is the carrier effective mass. To further investigate the changes in σ and S, n and μ are measured using the Hall effect at 303 K, as shown in Fig. 4c. As the amorphous Si3N4 content increases, the n and μ decrease simultaneously. The n and μ exhibit a concurrent reduction with the increase of amorphous Si3N4 content, consequently leading to a decline in σ. First-principles calculations reveal that the m* of Ag2Se is approximately 0.89 m0 (m0 is the charge mass), while that of Ag2Se1−xNx reaches about 1.02 m0. The decreased n combined with increased m* collectively leads to an enhancement of S. Fig. 4d displays the variation of the PF for all samples. Within the range of 303–388 K, the PF values of Si3N4 incorporated samples decrease slightly compared to the Ag2Se matrix sample. This result is due to the combined effects of σ and S. In addition, to evaluate the stability of the samples, a cyclic test is conducted on the electrical properties of Ag2Se–0.5 wt% Si3N4, as illustrated in Fig. S2 (ESI†).
To explain the reasons for the change of n, the band structures of Ag2Se and Ag2Se1−xNx are obtained through first-principles calculations, as shown in Fig. 5. As shown in Fig. 5a and b, under heavy doping conditions, Ag2Se1−xNx exhibits a wide bandgap (∼0.251 eV) compared to Ag2Se (∼0.07 eV), and the Fermi level crosses the valence band, indicative of p-type degeneracy. Furthermore, Fig. 2c and the projected energy bands of each element in Fig. 5d–f demonstrate that N doping introduces impurity levels, forming a negative charge center and reducing the n. This suggests that the primary mechanism for the diminished n is the formation of negative charge centers after N substitutes Se sites, which shifts the Fermi level toward the valence band.
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Fig. 5 Energy band structures of Ag2Se and Ag2Se1−xNx. (a) and (b) Band structure. (c) Density of states. (d)–(f) Projection bands derived from Ag, Se, and N atoms. |
Fig. 6 examines the impact of the incorporation of amorphous Si3N4 on the thermal properties of Ag2Se. Fig. 6a shows that the κtot of all samples increases with temperature, and the κtot of the amorphous Si3N4-incorporated samples is significantly lower than that of the Ag2Se matrix. In general, the κtot of TE materials consists of electronic thermal conductivity (κe) and lattice thermal conductivity (κl), expressed as κtot = κe + κl, where κe is derived from the Wiedemann–Franz law: κe = LσT, with L representing the Lorenz constant. Fig. 6b illustrates the temperature dependence of κe. As temperature increases, κe gradually increases. Simultaneously, the incorporation of amorphous Si3N4 leads to a reduction in κe across the entire temperature range, due to the decrease in σ. Fig. 6c presents the temperature dependence of κl. As the temperature increases from 303 K to 388 K, κl initially decreases and then increases with increasing amorphous Si3N4 content. The incorporation of amorphous Si3N4 introduces a substantial number of dislocations and correspondingly generates pronounced strain fluctuations at the Ag2Se–Si3N4 interface (Fig. 6e–i), thereby enhancing phonon scattering. This effect is the primary cause of the observed decrease in κ1. For the sample with x = 0.7, κl shows an anomalous increase, suggesting that when the concentration of Si3N4 reaches a critical value (approximately x = 0.7 wt%), Si3N4 forms agglomerates (Fig. S4, ESI†), and the κ of amorphous Si3N4 (2–8 W m−1 K−1)32 has an important effect on Ag2Se–0.7 wt% Si3N4. Similar phenomena have been reported in other studies.21,33,34 As a result of the combined reduction in both κe and κl, the sample with x = 0.5 achieves the lowest κtot, ∼0.70 W m−1 K−1 at 303 K, representing a ∼32.0% decrease compared to the pure Ag2Se matrix. In comparison with the κtot and κl of Ag2Se in the state-of-the-art studies13,21,35–38 (Fig. 6d), one of the lowest values is achieved, underscoring the beneficial role of amorphous nano-Si3N4 in reducing the κ of Ag2Se.
To assess the TE performance of the samples, the zT values for all samples are calculated (Fig. 7a). In the temperature range of 303–388 K, the value of zT initially increases and then subsequently declines as the concentration of amorphous Si3N4 is increased. The sample with x = 0.5 exhibits the best TE performance, with a zT of 0.95 at 388 K, followed by x = 0.3 and x = 0.7, with zT values of 0.91 and 0.85, which are higher than that of the pure Ag2Se matrix (∼0.73). To further evaluate the TE performance across the entire temperature range, the zTavg for all samples within the range of 303 K to 388 K is calculated (Fig. 7b). These results are compared with state-of-the-art studies on the synthesized Ag2Se, demonstrating that our study is at an intermediate level.
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Fig. 7 zT of the Ag2Se–x wt% Si3N4 (x = 0, 0.3, 0.5, 0.7) samples. (a) zT of all samples. (b) Comparison of zTavg (303–388 K) between our study and state-of-the-art studies.17,20,34,39 |
To evaluate the mechanical properties, Vickers hardness tests are conducted on all samples. The tests are performed under a 9.8 N load for 10 s and repeated three times, and the Vickers hardness values are recorded by measuring the diagonal length of the square indentation on the material's surface.
As the amorphous Si3N4 content increases, the Vickers hardness values of the samples increase gradually (Fig. 8a). The Vickers hardness of the pure Ag2Se matrix is ∼0.26 GPa, while the sample with 0.7 wt% Si3N4 exhibited a hardness of ∼0.33 GPa, representing a ∼26.9% improvement compared to the Ag2Se matrix. The increase in Vickers hardness is primarily attributed to the distribution of amorphous Si3N4 on the grain boundaries, which inhibits crack propagation,40 as shown in Fig. 3c. Fig. 8b shows a gradual increase in compressive strength with increasing amorphous Si3N4 content. Moreover, the sample with 0.7 wt% Si3N4 exhibits the highest yield strength, reaching 116 MPa. Comparative analysis with state-of-the-art thermoelectric materials indicates a modest advantage in our study (Table 1). These results demonstrate that the incorporation of amorphous Si3N4 effectively enhances the mechanical properties of Ag2Se.
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Fig. 8 (a) Vickers hardness of the Ag2Se–x wt% Si3N4 (x = 0, 0.3, 0.5, 0.7) samples and (b) the compressive strain–stress curves of the Ag2Se–x wt% Si3N4 (x = 0, 0.3, 0.5, 0.7) samples. |
Footnotes |
† Electronic supplementary information (ESI) available. See DOI: https://doi.org/10.1039/d5tc01049g |
‡ Liedong Zhao and Hailan Zhang contributed equally to this study. |
This journal is © The Royal Society of Chemistry 2025 |