Solution-processed negative gauge factor PtSe2 strain sensors

Abstract

We undertake electrochemical exfoliation of a 2D semiconductor platinum diselenide, PtSe2 and investigate the piezoresistance response of a solution-processed network. Due to the large PtSe2 aspect ratios, exceeding 300, we achieve conformal flake-to-flake junctions and good inter-flake electrical coupling. Our measured piezoresistive gauge factor is negative (−5.45), consistent with the intrinsic negative gauge factor of PtSe2. This negative network gauge factor implies that strain is transferred from the substrate to the nanosheets. However, detailed modelling shows that the strain transferred to the nanosheets is much smaller than the applied strain, showing that conformal junctions do not necessarily lead to good mechanical coupling between nanosheets. Our model implies that this gauge factor is consistent with a strain transfer efficiency of 8.5%. Our strain sensor also demonstrated a cyclic response for over 1000 cycles, enabling the sensor to be used in future flexible optoelectronics applications.

Graphical abstract: Solution-processed negative gauge factor PtSe2 strain sensors

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Article information

Article type
Communication
Submitted
24 Mar 2025
Accepted
07 Jul 2025
First published
08 Jul 2025
This article is Open Access
Creative Commons BY license

Nanoscale, 2025, Advance Article

Solution-processed negative gauge factor PtSe2 strain sensors

C. Ilhan, E. Caffrey, S. Liu, J. Munuera, Z. Sofer, I. Plutnarová, M. A. Morris, J. N. Coleman and T. Carey, Nanoscale, 2025, Advance Article , DOI: 10.1039/D5NR01217A

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